Advancing the UV/EUV
Measurement Science


AXUV Series

100% Internal Quantum Efficiency in the UV/EUV

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UVG Series

100% Internal Quantum Efficiency and Improved Stability in the UV

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SXUV Series

Hundred of gigarads of radiation hardness; no degradation on exposure to 100 eV photons

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PN Series

Newly available diodes with a p-on-n structure and 100% IQE between 350 and 940 nm.

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International Radiation Detectors, Inc.

Uniformity, Spectral Response

Response uniformity of a 10 mm X 10 mm active area IRD photodiode used by NIST as a transfer standard in the 5 nm to 254 nm spectral region is shown in Figure 1. The response uniformity was within ± 0.5% when scanned with a 254 nm photon beam of 1 mm dia. For comparison, Figure 2 shows the uniformity of the UV enhanced diode which NIST currently uses as a transfer standard in the 200 nm to 400 nm spectral range [1]. As seen in Figure 2, the response uniformity of this device was within ± 2%.


Fig. 1: Uniformity of IRD photodiode at 240 nm [1].



Fig. 2: Uniformity tested at 240nm of UV enhanced photodiode used by NIST as a transfer standard for 200nm to 400[1]


The excellent spatial response uniformity of IRD photodiodes will provide better reproducibility than other commercially manufactured photodiodes and therefore exhibit a lower overall measurement uncertainty.

References:

1] Ping-Shine Shaw et. al. "The new ultraviolet spectral responsivity scale based on cryogenic radiometry at Synchrotron Ultraviolet Radiation Facility III"

Rev. of Sci. Instruments, Vol. 72, 2242-2247 (2001)