Advancing the UV/EUV
Measurement Science


AXUV Series

100% Internal Quantum Efficiency in the UV/EUV

AXUV Information

AXUV Products


UVG Series

100% Internal Quantum Efficiency and Improved Stability in the UV

UVG Information

UVG Products


SXUV Series

Hundred of gigarads of radiation hardness; no degradation on exposure to 100 eV photons

SXUV Information

SXUV Products

Electronics

Technical Information

Contact/Facilities

Publications

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International Radiation Detectors, Inc.

AXUV Photodiode arrays


 Sensitive Area
(mm2)		 Size
(mm)		 Package Type Shunt Resistance
(M-Ohm)		 Dark Current @ 50V Capacitance @ 0V Risetime (10-90%)
AXUV-3ELA# 1 (x3) 1 x 1 (x3) Ceramic 1000 300 pA 25 pF 2 nSec
AXUV-10EL# 1 (x10) 1 x 1 (x10) Ceramic 1000 10 nA 25 pF 1 nSec
AXUV-16ELO/G 10 (x16) 2 x 5 (x16) Ceramic 100 * 2 nF** 0.5 µSec**
AXUV-16EL 10 (x16) 2 x 5 (x16) Ceramic 100 * 2 nF** 0.5 µSec**
AXUV-20EL 3 (x20) .75 x 4 (x20) Ceramic 300 * 1 nF** 0.2 µSec**
AXUV-20ELM 3 (x20) .75 x 4 (x20) Ceramic 300 * 1 nF** 0.2 µSec**
AXUV-22EL 4 (x22) 1 x 4 (x22) Ceramic 200 * 1 nF** 0.2 µSec**

Notes: # Use with 10-50 volts bias.
* May be selected for a specific application.
** Devices with better values may be selected.

References:

1] R.L. Boivin, J.A. Goetz, E.S. Marmar, J.E. Rice and J.L. Terry, "High Resolution Bolometry on the Alcator C-Mod Tokamak (Invited)"

Rev. Sci. Instrum. Vol 70 (1), 260-264 (1999)

2] I. Furno et.al. , “Fast bolometric measurements on the TCV Tokamak”

Rev. of Sci. Instrum. Vol. 70 (12), 4552-4556 (1996)

3] D.S. Gray et.al., “Time resolved radiated power during tokamak disruptions and spectral averaging of AXUV photodiode response in DIII-D”

Rev. of Sci. Instrum., Vol. 75, no. 2, 376-381 (2004)