![]() Advancing the UV/EUV Measurement Science AXUV Series 100% Internal Quantum Efficiency in the UV/EUV AXUV Information
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UVG Series 100% Internal Quantum Efficiency and Improved Stability in the UV UVG Information
UVG Products SXUV Series Hundred of gigarads of radiation hardness; no degradation on exposure to 100 eV photons SXUV Information
SXUV Products PN Series Newly available diodes with a p-on-n structure and 100% IQE between 350 and 940 nm. PN Diodes: Information PN Diodes: Information Electronics
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References: 1] G.C. Idzorex and R.J. Bartlett, "Silicon Photodiode Characterization from 1 eV to 10 KeV" SPIE Vol. 3114, 349-356 (1997).
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