
Advancing the UV/EUV
Measurement Science
AXUV Series
100% Internal Quantum Efficiency in the UV/EUV
AXUV Information
AXUV Products
UVG Series
100% Internal Quantum Efficiency and Improved Stability in the UV
UVG Information
UVG Products
SXUV Series
Hundred of gigarads of radiation hardness; no degradation on exposure to 100 eV photons
SXUV Information
SXUV Products
PN Series
Newly available diodes with a p-on-n structure and 100% IQE between 350 and 940 nm.
PN Diodes: Information
PN Diodes: Information
Electronics
Technical Information
Services
Contact/Facilities
Publications
Payment Terms
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International Radiation Detectors, Inc.
High Speed AXUV Photodiodes
(use with 10-50 volts bias)
|
Sensitive Area (mm2) |
Size (mm) |
Package Type |
Rshunt
(MOhm) |
Dark Current @50V |
C@0V |
Risetime (10-90%) |
|
| AXUV5^ |
5 |
2.5 Ø |
TO-5 |
100 |
10 nA |
500 pF |
2 nSec |
|
| AXUV20HS1^ |
20 |
5 Ø |
Ceramic |
20 |
50 nA |
0.7 nF |
1 nSec# |
 |
| AXUV20HS1BNC^ |
20 |
5 Ø |
BNC |
20 |
50 nA |
0.7 nF |
1 nSec# |
|
| AXUV63HS1^ |
63 |
9 Ø |
Ceramic |
20 |
20 nA |
2 nF |
2 nSec |
|
| AXUV63HS1-CH-LP**^ |
63 |
9 Ø |
Metal |
20 |
20 nA |
2 nF |
2 nSec |
|
| AXUVHS3*~ |
5 x 10-3 |
.07 X .07 |
SSMA |
100 |
50 pA |
2 pF |
80 pSec |
|
| AXUVHS5*~ |
1 |
1 X 1 |
SMA |
1000 |
200 pA |
40 pF |
700 pSec |
|
| AXUVHS5A*~ |
1 |
1 X 1 |
TO46 |
1000 |
200 pA |
40 pF |
700 pSec |
|
| AXUVHS6*~ |
6.3 x 10-4 |
.025 X .025 |
SSMA |
1000 |
20 pA |
1 pF |
50 pSec |
|
| AXUVHS6A*~ |
6.3 x 10-4 |
.025 X .025 |
Ceramic (Cut) |
1000 |
20 pA |
1 pF |
50 pSec |
 |
| AXUVHS11*^ |
.28 |
.6 Ø |
SMA |
|
200 pA |
10 pF |
250 pSec |
|
| AXUVHS15*^ |
0.28 |
0.6Ø |
SMA/22 |
|
200 pA |
10 pF |
250 pSec |
|
| Part Number Extension Guide |
| BNC |
Detecting element mounted in a BNC type connector |
| HS |
High-speed detector |
| CH |
Detector with center hole |
| CH-OC |
Detector with hole off-center from package center |
| LP |
Low Package |
| -Cu |
Copper Pins |
| Notes: |
# 1 nSec@150 volts with high speed amplifiers |
| * |
Available with free
standing filters |
| ** |
Better values may be selected |
| ~ |
Use with 50 volts bias |
| ^ |
Use with 150 volts bias |
References:
1] G.C. Idzorex and R.J. Bartlett, "Silicon Photodiode Characterization from 1 eV to 10 KeV"
SPIE Vol. 3114, 349-356 (1997).
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