Advancing the UV/EUV
Measurement Science


AXUV Series

100% Internal Quantum Efficiency in the UV/EUV

AXUV Information

AXUV Products


UVG Series

100% Internal Quantum Efficiency and Improved Stability in the UV

UVG Information

UVG Products


SXUV Series

Hundred of gigarads of radiation hardness; no degradation on exposure to 100 eV photons

SXUV Information

SXUV Products

Electronics

Technical Information

Contact/Facilities

Publications

Payment Terms

 

International Radiation Detectors, Inc.

AXUV Photodiodes for Position Sensing

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Central Slit
(mm)		 Sensitive Area
(mm²) 		Size (mm) Package Type Shunt Resistance (M-Ohm) Dark Current @ 50V Capacitance @ OV Risetime(10-90%)
AXUVPS1 0.5Ø 11 (X4) 7.6Ø Metal 100 * 2 nF** 2µSec**
AXUVPS1A
AXUVPS1ALP 		0.7Ø 11(X4) 7.6Ø Metal
Ceramic 		100 * 2 nF** 2µSec**
AXUVPS1B
AXUVPS1BLP 		1Ø 11 (X4) 7.6Ø Metal 100 * 2 nF** 2µSec**
AXUVPS1G
AXUVPS1GLP 		1.6Ø 11 (X4) 7.6Ø Metal 100 * 2 nF** 2µSec**
AXUVPS1D
AXUVPS1DLP 		0.5 X 2.5 11 (X4) 7.6Ø Metal 100 * 2 nF** 2µSec**
AXUVPS1E
AXUVPS1ELP 		2 X 4 11 (X4) 7.6Ø Metal 100 * 2 nF** 2µSec**
AXUVPS1F
AXUVPS1FLP 		5Ø 11 (X4) 7.6Ø Metal 100 * 2 nF** 2µSec**
AXUVPS6
AXUVPS6S		 N/A 11 (X4) 7.6Ø Metal 100 * 2 nF** 2µSec**
AXUVPS7
5.6Ø 38 (X4) 15Ø Metal 10 * 1.2 nF** 2µSec**
AXUVPS8
3Ø 121 (X4) 25Ø Metal 5 * 10 nF** 6µSec**
AXUVPS2 1 X 2 25 (X4) 5X5 (X4) Metal 100 * 5 nF** 4µSec**
AXUVPS3 N/A 25 (X4) 5X5 (X4) Metal 100 * 5 nF** 4µSec**
AXUVPS2LP N/A 25 (X4) 5X5 (X4) Metal 100 * 5 nF** 4µSec**
AXUVPS3C N/A 25 (X4) 5X5 (X4) Ceramic 100 * 5 nF** 4µSec**
AXUVPS4
AXUVPS4C 		N/A
N/A 		1.25(X4) 2.5Ø To-5 1000 * 0.18 nF** 0.1µSec**
AXUVPS5 N/A 24 (X4) 3X8   100 * 5 nF** 4µSec**
AXUVPSV N/A 330 22 X 15 PSV 20 * 40 nF** 15µSec**
AXUV600M N/A 150 (X4) 27 X 27 Metal 20 * 30 nF** 12µSec**

Notes:
* May be selected for a specific application at no additional cost.
** Devices with better values may be selected.
# Four detectors mare needed to realize a variable x-y slit.

References:

1] R.G. Van Sifhout, "A Beam Tracking Optical Table of Sychrotron X-ray Beamline"

Nucl. Instrum. and Methods A, Vol. 403, p. 153-160 (1998).