Advancing the UV/EUV
Measurement Science


AXUV Series

100% Internal Quantum Efficiency in the UV/EUV

AXUV Information

AXUV Products


UVG Series

100% Internal Quantum Efficiency and Improved Stability in the UV

UVG Information

UVG Products


SXUV Series

Hundred of gigarads of radiation hardness; no degradation on exposure to 100 eV photons

SXUV Information

SXUV Products

Electronics

Technical Information

Contact/Facilities

Publications

Payment Terms

 

International Radiation Detectors, Inc.

Quantum Efficiency Stability

The radiation hardness of AXUV diodes is 100 to 1,000 Mrads (SiO2) when tested with 10 eV photons. This hardness is about 10,000 times greater than that of commonly available PIN silicon photodiodes.

Diodes with 1 Gigarad (SiO2) hardness are fabricated by nitrogen doping at the Si-SiO2 interface to form an oxynitride window instead of the standard silicon dioxide window. Letter G at the end of a model number indicates this type of device. The 1 Gigarad (SiO2) hardness achieved is the highest hardness ever reported or known to exist in any silicon device.

AXUV diodes with nitrided silicon dioxide passivating layer did not show any change in quantum efficiency after their exposure to 100% relative humidity for 4 weeks and room temperature storage for a few years.