International Radiation Detectors, Inc.
Quantum Efficiency
Stability
The radiation hardness of AXUV diodes is 100 to 1,000
Mrads (SiO2) when tested with 10 eV photons. This hardness
is about 10,000 times greater than that of commonly
available PIN silicon photodiodes.
Diodes with 1 Gigarad (SiO2) hardness are fabricated by
nitrogen doping at the Si-SiO2 interface to form an
oxynitride window instead of the standard silicon dioxide
window. Letter G at the end of a model number indicates this
type of device. The 1 Gigarad (SiO2) hardness achieved is
the highest hardness ever reported or known to exist in any
silicon device.
AXUV diodes with nitrided silicon dioxide passivating layer
did not show any change in quantum efficiency after their
exposure to 100% relative humidity for 4 weeks and room
temperature storage for a few years.
Owing to their above characteristics, AXUV Photodiodes are
being used by NIST
as transfer standards in 5 nm to 250 nm range.
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