International Radiation Detectors, Inc.
Transmission Mode Detectors
AXUV detectors with thin physical Si thickness operate as transmission mode detectors.
These detectors are capable of precisely measuring x-ray fluxes in applications such as synchrotron beam measurements or energy dispersive electron microscopy. Best transmissiona and minimal beam disruption is achieved when operating at beam energies well about the silicon k-edge of 1.84 keV (Figure 2). Because the detector is only 5 µm thin, beam parallax is minimized. In addition, the detector transmission is very unidform through the detector, as seen in measurements performed by PTB (Figure 3).
With 5 µm physical silicon thickness, typical device responsivity and transmission curves are as follows:
Figure 1: X-ray responsivity for 5 µm physical thickness AXUV photodiode.
Figure 2: X-ray transmission for 5 µm physical thickness AXUV photodiode.
Figure 3: Relative uniformity transmission scan for 5 µm physical thickness AXUV photodiode, PTB data.
Click name to download DWF Version of image
|
Sensitive Area (mm2) |
Size (mm²) |
Package Type |
Shunt Resistance (M-Ohm) @10mV |
Dark Current @50V |
Capacitance @0V |
Risetime (10%-90%) |
| AXUV36@ |
36 |
6 X 6 |
Metal |
10 |
* |
10 nF** |
10 µSec** |
| Notes |
| @ |
With 5 µm physical Silicon thickness for x-ray application. See "X-ray" section |
* |
May be selected for a specific application at no additional cost. |
| ** |
Devices with better values may be selected. |
|