Advancing the UV/EUV
Measurement Science


AXUV Series

100% Internal Quantum Efficiency in the UV/EUV

AXUV Information

AXUV Products


UVG Series

100% Internal Quantum Efficiency and Improved Stability in the UV

UVG Information

UVG Products


SXUV Series

Hundred of gigarads of radiation hardness; no degradation on exposure to 100 eV photons

SXUV Information

SXUV Products

Electronics

Technical Information

Contact/Facilities

Publications

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International Radiation Detectors, Inc.

SXUV Position Sensing

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Central Slit (mm) Sensitive Area
(mm²) 		Size (mm) Package Type Shunt Resistance (M-Ohm) Dark Current @ 50V Capacitance @ OV Risetime (10-90%)
SXUVPS1 0.5Ø 11 (X4) 7.6Ø Metal 10 * 2 nF** 2µSec**
SXUVPS1A
SXUVPS1ALP 		0.7Ø 11 (X4) 7.6Ø Metal
Ceramic 		10 * 2 nF** 2µSec**
SXUVPS1B
SXUVPS1BLP 		1Ø 10.75 (X4) 7.6Ø Metal 10 * 2 nF** 2µSec**
SXUVPS1G
SXUVPS1GLP 		1.6Ø 10.5 (X4) 7.6Ø Metal 10 * 2 nF** 2µSec**
SXUVPS1D
SXUVPS1DLP 		0.5 X 2.5 10.75 (X4) 7.6Ø Metal 10 * 2 nF** 2µSec**
SXUVPS1E
SXUVPS1ELP 		2 X 4 9 (X4) 7.6Ø Metal 10 * 2 nF** 2µSec**
SXUVPS1F
SXUVPS1FLP 		5Ø 6 (X4) 7.6Ø Metal 10 * 2 nF** 2µSec**
SXUVPS6
SXUVPS6S 		N/A
N/A 		11 (X4) 7.6Ø Metal 10 * 2 nF** 2µSec**
SXUVPS2
SXUVPS2LP		 1 X 2
1 X 2
 24.5 (X4) 5 X 5 (X4) Metal 10 * 5 nF** 4µSec**
SXUVPS3
SXUVPS3C 		N/A
N/A 		25 (X4) 5 X 5 (X4) Metal 10 * 5 nF** 4µSec**
SXUVPS4
SXUVPS4C
SXUVPS4S 		N/A
N/A
N/A 		1.25(X4) 2.5Ø Metal 200 * 0.18 nF**   0.1µSec**
SXUVPS5 N/A 24 (X4) 3 X 8 Metal 20 * 5 nF** 12µSec**
SXUV600M N/A 150 (X4) 27 X 27 Metal 5 * 30 nF 15µSec**

Notes: * May be selected for a specific application at no additional cost.
** Devices with better values may be selected.

References:

[1] R.G. Van Sifhout
"A Beam Tracking Optical Table of Sychrotron X-ray Beamline"

Nucl. Instrum. and methods A, Vol. 403, 153-160 (1998)