Advancing the UV/EUV
Measurement Science


AXUV Series

100% Internal Quantum Efficiency in the UV/EUV

AXUV Information

AXUV Products


UVG Series

100% Internal Quantum Efficiency and Improved Stability in the UV

UVG Information

UVG Products


SXUV Series

Hundred of gigarads of radiation hardness; no degradation on exposure to 100 eV photons

SXUV Information

SXUV Products

Electronics

Technical Information

Contact/Facilities

Publications

Payment Terms

 

International Radiation Detectors, Inc.

Temperature Dependence

Figure 1 shows the temperature dependence of the AXUV, SXUV and UVG diodes responsivity at 254 nm. Typically the responsivity was found to increase by .03% per degree Celsius. As shown in Figure 2, the temperature dependence of AXUV and SXUV diode responsivity is essentially the same down to 1 nm. This suggests that the responsivity temperature dependence in this region is caused by an increase in the quantum yield (owing to reduction in the bandgap) with higher temperature.

Because of presence of surface recombination in the SXUV diodes, their responsivity temperature dependence is expected to be lower then that of the AXUV diodes. The surface recombination is known to have negative temperature dependence. However, we have not been able to verify the lower temperature dependence of the SXUV responsivity experimentally.


Fig. 1: Change in 254 nm responsivity of AXUV, SXUV and UVG photodiodes with temperature


Fig. 2: Change in the SXUV and AXUV photodiode responsivity with temperature


The positive temperature coefficient of responsivity at wavelengths above 700 nm shown in the center figure on back cover is caused by an increase in the minority carrier lifetime with temperature. The increased lifetime results into increased diffusion length and thus higher carrier collection.


Fig. 3 shows typical temperature dependence of the shunt resistance of AXUV/UVG/SXUV photodiodes. The shunt resistance was found to decrease by a factor of 2 for every 7.5°C rise in temperature.


Fig. 3: Change in shunt resistance of AXUV, SXUV and UVG photodiodes with temperature.


Fig. 4 shows the typical temperature dependence of capacitance for the IRD photodiodes over a temperature range of 0°C to 40°C. The positive temperature dependence of diode capacitance occurs because the intrinsic carrier concentration increases with temperature which results in the reduction of built-in potential.


Fig. 4: Temperature dependence of zero bias capacitance of AXUV, SXUV and UVG diodes, with 5 mm dia. active area.